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1.
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DIGITAL SYSTEMS TESTING AND TESTABLE DESIGN
by Abramovici, Miron | Friedman, Arthur D. Material type:  Book Description: xxi,653.Publisher: New York Computer Science Press c1990Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3815 Ab82d] (1).
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2.
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DEVELOPMENTS IN INTEGRATED CIRCUIT TESTING
by Miller, D. M. Material type: Book Description: x,440.Publisher: London Academic Pr. c1987Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 D492] (1).
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3.
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ANALOG SIGNAL GENERATION FOR BUILT-IN-SELF-TEST OF MIXED-SIGNAL INTEGRATED CIRCUITS
by Roberts,Gordon W | Lu,Albert K. Material type: Book Description: viii,122.Publisher: Kluwer Academic Publishers, Boston c1995Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.381548 R542A] (1).
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4.
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RANDOM TESTING OF DIGITAL CIRCUITS
by David,Rene. Material type: Book; Format:
print
; Literary form:
not fiction
Description: xix,475.Publisher: Marcel Dekker, New York 1998Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3815 D281R] (1).
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5.
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RF MEASUREMENTS OF DIE AND PACKAGES
by Wartenberg,Scott A. Material type: Book Description: xv,224.Publisher: Artech House, Boston c2002Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3815 W264R] (1).
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6.
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Digital integrated circuits
: disign-for-test using simulink and stateflow
by Perelroyzen, Evgeni. Material type: Book; Format:
print
; Literary form:
not fiction
Description: 320p.Publisher: Boca Raton Crc Press 2007Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3815 P414d] (1).
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7.
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Test and diagnosis of analogue, mixed-signal and RF integrated circuits
: the system on chip approach
by | Sun,Yichuang, Ed. Material type: Book; Format:
print
; Literary form:
not fiction
Description: xx, 389p.Publisher: London The Institution Of Engineering And Technology 2008Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38150287 T286] (1).
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8.
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Test and diagnosis for small-delay defects
by Tehranipoor, Mohammad | Peng, Ke. Material type: Book; Format:
print
; Literary form:
not fiction
Description: xviii, 212p.Publisher: New York Springer 2011Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.381548 T233m] (1).
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9.
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Nanometer technology designs high-quality delay tests
by Tehranipoor, Mohammad | Ahmed, Nisar. Material type: Book; Format:
print
; Literary form:
not fiction
Description: xvii, 281p.Publisher: New York Springer 2008Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.381548 T233n] (1).
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