DIGITAL SYSTEMS TESTING AND TESTABLE DESIGN
By: Abramovici, Miron.
Contributor(s): Friedman, Arthur D.
Material type:
BookPublisher: New York Computer Science Press c1990Description: xxi,653.ISBN: 0716781794.Subject(s): Digital Integrated Circuits -- Testing | Digital Integrated Circuits -- Design And ConstructionDDC classification: 621.3815 | Ab82d
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.3815 Ab82d (Browse shelf) | Book Request | Available | A114242 |
Total holds: 0
There are no comments for this item.