DEVELOPMENTS IN INTEGRATED CIRCUIT TESTING
By: Miller, D. M.
Material type:
BookSeries: Perspectives In Computing V. 18. Publisher: London Academic Pr. c1987Description: x,440.ISBN: 0124967533.Subject(s): Digital Integrated Circuits -- TestingDDC classification: 621.38173 | D492
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38173 D492 (Browse shelf) | Book Request | Available | A100700 |
Total holds: 0
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