RANDOM TESTING OF DIGITAL CIRCUITS
By: David,Rene.
Material type: BookPublisher: Marcel Dekker, New York 1998Description: xix,475.ISBN: 0824701828.Subject(s): Digital Integrated Circuits - TestingDDC classification: 621.3815 | D281RItem type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 621.3815 D281R (Browse shelf) | Available | A125903 |
Total holds: 0
Includes Bibliographical References And Index
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