Nanometer technology designs high-quality delay tests
By: Tehranipoor, Mohammad.
Contributor(s): Ahmed, Nisar.
Material type:
BookPublisher: New York Springer 2008Description: xvii, 281p.ISBN: 9780387764863.Subject(s): Nanotechnology | Integrated circuits--Testing | Integrated circuits--Very large scale integration | Computer engineeringComputer-aided design | Systems engineeringDDC classification: 621.381548 | T233n
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.381548 T233n (Browse shelf) | Book Request | Available | A177610 |
Total holds: 0
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