Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

Your search returned 519 results. Subscribe to this search

|
261. CIRCUITS, INTERCONNECTIONS AND PACKING FOR VLSI

by Bakoglu, H. B.

Material type: book Book Description: xiv,527.Publisher: Reading, Mass. Addison-Wesley c1990Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 B179c] (1).

262. COMPUTER AIDED TOOLS FOR VLSI SYSTEM DESIGN

by Russell, G.

Material type: book Book Description: viii,192.Publisher: London Peter Peregrimes c1987Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 C739] (1).

263. E-PLANE INTEGRATED CIRCUITS

by Bhartia, Prakash | Pramanick, Protap.

Material type: book Book; Format: print ; Literary form: not fiction Description: xiii,488.Publisher: Noorwood, Ma. Artech 1987Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 B469e] (1).

264. HIERARCHICAL MODELING FOR VLSI CIRCUIT TESTING

by Bhattacharya, Debashis | Hayes, John P.

Material type: book Book Description: x,159.Publisher: Boston Kluwer Academic Pub. c1990Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 B469h] (1).

265. FUNDAMENTALS OF INTEGRATED CIRCUIT TECHNOLOGY

by Fortino, Andres G.

Material type: book Book Description: xiv,305.Publisher: Reston, Virginia Reston Pub. c1984Availability: Items available for reference: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 F776f] (1).

266. DEVELOPMENTS IN INTEGRATED CIRCUIT TESTING

by Miller, D. M.

Material type: book Book Description: x,440.Publisher: London Academic Pr. c1987Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 D492] (1).

267. HANDBOOK OF ANALOG CIRCUIT DESIGN

by Feucht, Dennis L.

Material type: book Book Description: xvii,685.Publisher: San Diego Academic Press c1990Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 F432h] (1).

268. INTRODUCTION TO VLSI TESTING

by Feugate, Robert J | Mcintyre, Steven M.

Material type: book Book; Format: print ; Literary form: not fiction Description: xiii,226.Publisher: Englewood Cliffs Prentice Hall 1988Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 F434i] (1).

269. VLSI SIGNAL PROCESSING TECHNOLOGY

by Magdy A. Bayoumi,Earl E. Swartzlander | Swartzlander,Earl E.

Material type: book Book Description: xii,234.Publisher: Kluwer Academic Publishers, Boston c1994Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3822 V84B] (1).

270. PRINCIPLES OF DATA CONVERSION SYSTEM DESIGN

by Razavi,Behzad.

Material type: book Book Description: xiii,256.Publisher: Ieee Press, New York c1995Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.39814 R219P] (1).

271. ANALOG SIGNAL GENERATION FOR BUILT-IN-SELF-TEST OF MIXED-SIGNAL INTEGRATED CIRCUITS

by Roberts,Gordon W | Lu,Albert K.

Material type: book Book Description: viii,122.Publisher: Kluwer Academic Publishers, Boston c1995Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.381548 R542A] (1).

272. RANDOM TESTING OF DIGITAL CIRCUITS

by David,Rene.

Material type: book Book; Format: print ; Literary form: not fiction Description: xix,475.Publisher: Marcel Dekker, New York 1998Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3815 D281R] (1).

273. ANALOG VLSI AND NEURAL SYSTEMS

by Mead, Carver.

Material type: book Book; Format: print ; Literary form: not fiction Description: xxii,371.Publisher: Reading, Mass. Addison-Wesley 1989Availability: No items available Checked out (1).

274. FUZZY HARDWARE

by Abraham No Kandel,Gideon No Langholz | Langholz,Gideon.

Material type: book Book Description: xiii422.Publisher: Kluwer Academic Publishers, Boston c1998Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.399 F999K] (1).

275. RELIABILITY, YIELD, AND STRESS BURN-IN

by Kuo,Way, Chien,Wei-Ting Kary | Kim,Taeho.

Material type: book Book; Format: print ; Literary form: not fiction Description: xxvi,394.Publisher: Kluwer Academic Publishers,Boston 1998Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.381 K964R] (1).

276. INTRODUCTION TO DEVICE MODELING AND CIRCUIT SIMULATION

by Fjeldly,Tor A, Ytterdal,Trond | Shur,Michael.

Material type: book Book; Format: print ; Literary form: not fiction Description: xiii,409.Publisher: John Wiley, New York 1998Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38152011 F589I] (1).

277. INTEGRATING DESIGN AND TEST

by Parker,Kenneth P.

Material type: book Book; Format: print ; Literary form: not fiction Description: x,144.Publisher: Computer Society Press, Washington, D.C. 1987Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.395 P226I] (1).

278. IC MASTER [3 volume set]

by Mitsubishi.Electronic Device Group | Mitsubishi.Electronic Device Group.

Material type: book Book; Format: print ; Literary form: not fiction Description: various pagings.Publisher: New York Hearst Business Communications 1998Availability: Items available for reference: PK Kelkar Library, IIT Kanpur [Call number: 621.38150294 Ic1 v.1] (3).

279. LINEAR INTEGRATED CIRCUITS

by Prensky,Sol D | Seidman,Arthur H.

Material type: book Book; Format: print ; Literary form: not fiction Description: xiv,354.Publisher: Reston Publishing Co., Reston 1981Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3815 P918L] (1).

280. ANALOG VHDL

by Andrzej T. Rosinski,Alain No Vachoux | Vachoux,Alain.

Material type: book Book; Format: print ; Literary form: not fiction Publisher: Kluwer Academic Publishers, Boston 1998Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.392 AN13R] (1).

Powered by Koha