RELIABILITY, YIELD, AND STRESS BURN-IN
By: Kuo,Way, Chien,Wei-Ting Kary.
Contributor(s): Kim,Taeho.
Material type:
BookPublisher: Kluwer Academic Publishers,Boston 1998Description: xxvi,394.ISBN: 0792381076.Subject(s): Integrated Circuits--Design And Construction | Microelectronics--Reliability | Computer Software--DevelopmentDDC classification: 621.381 | K964R
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.381 K964R (Browse shelf) | Book Request | Available | A126385 |
Total holds: 0
There are no comments for this item.