HIERARCHICAL MODELING FOR VLSI CIRCUIT TESTING
By: Bhattacharya, Debashis.
Contributor(s): Hayes, John P.
Material type:
BookPublisher: Boston Kluwer Academic Pub. c1990Description: x,159.ISBN: 079239058X.Subject(s): Very Large Scale Integration -- Testing | Integrated Circuits -- Very Large Scale Integration -- Computer SimulationDDC classification: 621.38173 | B469h
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | General Stacks | 621.38173 B469h (Browse shelf) | Available | A113644 |
Total holds: 0
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