PKK Library catalog › Results of search for 'su:{Digital integrated circuits -- Testing}'

	1.	DIGITAL SYSTEMS TESTING AND TESTABLE DESIGN by Abramovici, Miron \| Friedman, Arthur D. Material type: Book Description: xxi,653.Publisher: New York Computer Science Press c1990Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3815 Ab82d] (1). Place hold Add to cart (remove)
	2.	DEVELOPMENTS IN INTEGRATED CIRCUIT TESTING by Miller, D. M. Material type: Book Description: x,440.Publisher: London Academic Pr. c1987Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 D492] (1). Place hold Add to cart (remove)
	3.	RANDOM TESTING OF DIGITAL CIRCUITS by David,Rene. Material type: Book; Format: print ; Literary form: not fiction Description: xix,475.Publisher: Marcel Dekker, New York 1998Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3815 D281R] (1). Place hold Add to cart (remove)
	4.	Digital integrated circuits : disign-for-test using simulink and stateflow by Perelroyzen, Evgeni. Material type: Book; Format: print ; Literary form: not fiction Description: 320p.Publisher: Boca Raton Crc Press 2007Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3815 P414d] (1). Place hold Add to cart (remove)

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