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261.
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HANDBOOK OF METAL TREATMENTS AND TESTING
by Ross, Robert B. Edition: 2ndMaterial type:  Book; Format:
print
; Literary form:
not fiction
Description: xix,568.Publisher: London Chapman And Hall 1988Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 671.7 R733h2] (1).
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262.
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INSPECTION OF METALS
by Anderson, Robert Clark. Material type: Book Description: 3 v.Publisher: Metals Park Asm International c1988Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 671.7 An24i] (1).
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263.
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STRUCTURED LOGIN TESTING
by Eichelberger, Edward B. Material type: Book Description: xvii,183.Publisher: Englewood Cliffs Prentice Hall c1991Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 St89] (1).
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264.
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SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION
by Schroder, Dieter K. Material type: Book Description: xv,599.Publisher: New York John Wiley c1990Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38152 Sch75s] (1).
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265.
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TESTING ACTIVE AND PASSIVE ELECTRONIC COMPONENTS
by Powell, Richard F. Material type: Book; Format:
print
; Literary form:
not fiction
Description: x,218.Publisher: New York Dekker 1987Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.381548 P871t] (1).
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266.
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HIERARCHICAL MODELING FOR VLSI CIRCUIT TESTING
by Bhattacharya, Debashis | Hayes, John P. Material type: Book Description: x,159.Publisher: Boston Kluwer Academic Pub. c1990Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 B469h] (1).
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267.
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DEVELOPMENTS IN INTEGRATED CIRCUIT TESTING
by Miller, D. M. Material type: Book Description: x,440.Publisher: London Academic Pr. c1987Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 D492] (1).
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268.
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INTRODUCTION TO VLSI TESTING
by Feugate, Robert J | Mcintyre, Steven M. Material type: Book; Format:
print
; Literary form:
not fiction
Description: xiii,226.Publisher: Englewood Cliffs Prentice Hall 1988Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 F434i] (1).
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269.
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NDT DATA FUSION
by Gros,X. E. Material type: Book; Format:
print
; Literary form:
not fiction
Description: x,205.Publisher: Arnold,London 1997Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 620.1127 G912N] (1).
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270.
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LOAD TESTING OF DEEP FOUNDATIONS
by Crowther, Carroll L. Material type: Book; Format:
print
; Literary form:
not fiction
Description: xi,233.Publisher: New York Wiley 1988Availability: Items available for reference: PK Kelkar Library, IIT Kanpur [Call number: 624.154 C886L] (1).
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271.
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EXPERIMENTAL TECHNIQUES IN FRACTURE
by Jonathan S. Epstein | Epstein,Jonathan S. Material type: Book Description: xii,514.Publisher: Vch Pub. Inc., New York c1993Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 620.1126 EX71T] (1).
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272.
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GEOTECHNICAL INSTRUMENTATION FOR MONITORING FIELD PERFORMANCE
by Dunnicliff, John | Green, Gordon E. Material type: Book Description: xx,577.Publisher: New York Wiley c1988Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 624.151028 D922g] (1).
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273.
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EXPERIMENTAL CHARACTERIZATION OF ADVANCED COMPOSITE MATERIALS
by Carlsson,Leif A | Pipes,R. Byron. Edition: 2ndMaterial type: Book Description: xii,182.Publisher: Technomic Pub. Co., Lancaster c1997Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 620.1180287 C197E2] (1).
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274.
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NONDESTRUCTIVE TESTING
by Cartz,Louis. Material type: Book Description: x,229.Publisher: Asm International, Ohio c1995Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 620.1127 C249N] (1).
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275.
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INTRODUCTION TO THE NON-DESTRUCTIVE TESTING OF WELDED JOINTS
by Halmshaw,R. Edition: 2ndMaterial type: Book Description: xiv,126.Publisher: Abington Pub., Cambridge c1996Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 620.1127 H162I2] (1).
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276.
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ELECTROMAGNETIC NONDESTRUCTIVE EVALUATION
by T. No Takagi,J. R. Bowler,Y. No Yoshida | Yoshida,Y. Material type: Book; Format:
print
; Literary form:
not fiction
Description: viii,320.Publisher: Ios Press, Amsterdam 1997Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 620.11278 EL25T] (1).
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277.
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ANALOG SIGNAL GENERATION FOR BUILT-IN-SELF-TEST OF MIXED-SIGNAL INTEGRATED CIRCUITS
by Roberts,Gordon W | Lu,Albert K. Material type: Book Description: viii,122.Publisher: Kluwer Academic Publishers, Boston c1995Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.381548 R542A] (1).
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278.
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FLYING QUALITIES AND FLIGHT TESTING OF THE AIRPLANE
by Stinton,Darrol. Material type: Book Description: xxxix,667.Publisher: John Wiley, New York c1996Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 629.13453 ST57F] (1).
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279.
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RANDOM TESTING OF DIGITAL CIRCUITS
by David,Rene. Material type: Book; Format:
print
; Literary form:
not fiction
Description: xix,475.Publisher: Marcel Dekker, New York 1998Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3815 D281R] (1).
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280.
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DYNAMIC LOADING AND CHARACTERIZATION OF FIBER-REINFORCED COMPOSITES
by Sierakowski,Robert L | Chaturvedi,Shive K. Material type: Book Description: xiii,252.Publisher: John Wiley, New York c1997Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 620.118 SI17D] (1).
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