PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY
By: Egerton,Ray F.
Material type:
BookPublisher: Springer Science+Business Media Inc., New York 2005Description: v,202.ISBN: 0 387 25800 0.Subject(s): Scanning Electron Microscopy | Electron Microscopy | X-Ray MicroanalysisDDC classification: 502.825 | EG28P
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | General Stacks | 502.825 EG28P (Browse shelf) | Checked out to Vardhman Dwivedi (S24106003300) | 12/11/2024 | A153884 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: General Stacks Close shelf browser
| 502.825 AD95 ADVANCED SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS | 502.825 B976d DYNAMIC EXPERIMENTS IN THE ELECTRON MICROSCOPE | 502.825 C76 ELECTRON MICROSCOPY AND ANALYSIS | 502.825 EG28P PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY | 502.825 G618f Thin foil preparation for electron microscopy | 502.825 In1 In-situ electron microscopy at high resolution | 502.825 K299 Kelvin probe force microscopy |
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