502.825 / EG28P
Egerton,Ray F.
PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY / AN INTRODUCTION TO TEM, SEM AND AEM .- Springer Science+Business Media Inc., New York, 2005 .- v,202 .
ISBN: 0 387 25800 0
Subject Headings:
Scanning Electron Microscopy;
Electron Microscopy;
X-Ray Microanalysis;
Copy Details:
Acc. No.: A153884, Full Call No.: 502.825 EG28P, Item type: Books , Location: General Stacks,
------------------------- --------------------- ------ --------- ------- ------- --------- --------
Egerton,Ray F.
PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY / AN INTRODUCTION TO TEM, SEM AND AEM .- Springer Science+Business Media Inc., New York, 2005 .- v,202 .
ISBN: 0 387 25800 0
Subject Headings:
Scanning Electron Microscopy;
Electron Microscopy;
X-Ray Microanalysis;
Copy Details:
Acc. No.: A153884, Full Call No.: 502.825 EG28P, Item type: Books , Location: General Stacks,
------------------------- --------------------- ------ --------- ------- ------- --------- --------