PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY
By: Egerton,Ray F.
Material type:
BookPublisher: Springer Science+Business Media Inc., New York 2005Description: v,202.ISBN: 0 387 25800 0.Subject(s): Scanning Electron Microscopy | Electron Microscopy | X-Ray MicroanalysisDDC classification: 502.825 | EG28P
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | General Stacks | 502.825 EG28P (Browse shelf) | Checked out to Vardhman Dwivedi (S24106003300) | 14/10/2024 | A153884 |
Total holds: 0
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