| 000 -LEADER |
|---|
| fixed length control field |
00558pam a2200181a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b2005 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0 387 25800 0 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
502.825 |
| Item number |
EG28P |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Egerton,Ray F. |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY |
| Statement of responsibility, etc. |
AN INTRODUCTION TO TEM, SEM AND AEM |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
|
| Name of publisher, distributor, etc. |
Springer Science+Business Media Inc., New York |
| Date of publication, distribution, etc. |
2005 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
v,202 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Scanning Electron Microscopy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Electron Microscopy |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
X-Ray Microanalysis |
| 964 ## - |
|---|
| -- |
CIRC |
| 997 ## - |
|---|
| -- |
A153884 C |
