TESTING AND RELIABLE DESING OF CMOS CIRCUITS
By: Jha, Niraj K.
Contributor(s): Kundu, Sandip.
Material type: BookPublisher: Boston Kluwer Academic Pub. c1990Description: xiii,231.ISBN: 07923390563.Subject(s): Metal Oxide Semiconductors, Complementary -- Testing | Metal Oxide Semiconductros, Complementary -- Raliability | Integrated Circuits -- Very Large Scale IntegrationDDC classification: 621.39732 | J559tItem type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Written-off | PK Kelkar Library, IIT Kanpur | Written-of | 621.39732 J559t (Browse shelf) | Not for loan | A113982 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves Close shelf browser
621.395 C314 Digital design and verilog HDL fundamentals | 621.396 P262i2 INDUSTRIAL ELECTRIC FURNACES AND APPLIANCES | 621.396 Sy68 ELECTRIC ARC FURNACE-QUO VADIS | 621.39732 J559t TESTING AND RELIABLE DESING OF CMOS CIRCUITS | 621.398 H778L LOCAL AREA NETWORK DESIGN | 621.399 L95i INTRODUCTRORY COMPUTER VISION AND IMAGE PROCESSING | 621.399 L973P PATTERN RECOGNITION AND IMAGE PROCESSING |
There are no comments for this item.