621.39732 / J559t
Jha, Niraj K.
TESTING AND RELIABLE DESING OF CMOS CIRCUITS / .- Boston: Kluwer Academic Pub., c1990 .- xiii,231 .
ISBN: 07923390563
Subject Headings:
Metal Oxide Semiconductors, Complementary -- Testing;
Metal Oxide Semiconductros, Complementary -- Raliability;
Integrated Circuits -- Very Large Scale Integration;
Author Added Entry:
Kundu, Sandip;
Copy Details:
Acc. No.: A113982, Full Call No.: 621.39732 J559t, Item type: Written-off , Location: ,
------------------------- --------------------- ------ --------- ------- ------- --------- --------
Jha, Niraj K.
TESTING AND RELIABLE DESING OF CMOS CIRCUITS / .- Boston: Kluwer Academic Pub., c1990 .- xiii,231 .
ISBN: 07923390563
Subject Headings:
Metal Oxide Semiconductors, Complementary -- Testing;
Metal Oxide Semiconductros, Complementary -- Raliability;
Integrated Circuits -- Very Large Scale Integration;
Author Added Entry:
Kundu, Sandip;
Copy Details:
Acc. No.: A113982, Full Call No.: 621.39732 J559t, Item type: Written-off , Location: ,
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