| 000 -LEADER |
|---|
| fixed length control field |
00630pam a2200193a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408bc1990 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
07923390563 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.39732 |
| Item number |
J559t |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Jha, Niraj K. |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
TESTING AND RELIABLE DESING OF CMOS CIRCUITS |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Boston |
| Name of publisher, distributor, etc. |
Kluwer Academic Pub. |
| Date of publication, distribution, etc. |
c1990 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xiii,231 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Metal Oxide Semiconductors, Complementary -- Testing |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Metal Oxide Semiconductros, Complementary -- Raliability |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Integrated Circuits -- Very Large Scale Integration |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Kundu, Sandip |
| 964 ## - |
|---|
| -- |
CIRC |
| 997 ## - |
|---|
| -- |
A113982 C |
