TESTING AND RELIABLE DESING OF CMOS CIRCUITS
By: Jha, Niraj K.
Contributor(s): Kundu, Sandip.
Material type:
BookPublisher: Boston Kluwer Academic Pub. c1990Description: xiii,231.ISBN: 07923390563.Subject(s): Metal Oxide Semiconductors, Complementary -- Testing | Metal Oxide Semiconductros, Complementary -- Raliability | Integrated Circuits -- Very Large Scale IntegrationDDC classification: 621.39732 | J559t
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
| Written-off | PK Kelkar Library, IIT Kanpur | Written-of | 621.39732 J559t (Browse shelf) | Not for loan | A113982 |
Total holds: 0
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