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Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

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1.
DESIGN OF TESTABLE LOGIC CIRCUITS

by Bennetts, R. G.

Material type: book Book; Format: print ; Literary form: not fiction Description: xii,164.Publisher: London Addison Wesley 1984Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3819535 B439d] (1).

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2.
LOGIC TESTING AND DESIGN FOR TESTABILITY

by Fujiwara, Hideo.

Material type: book Book; Format: print ; Literary form: not fiction Description: x,284.Publisher: Cambridge Mit Pr. 1985Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.381537 F955L] (1).

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3.
SEQUENTIAL LOGIC TESTING AND VERIFICATION

by Ghosh, Abhijit | Newton, A. Richard.

Material type: book Book Description: xv,214.Publisher: Boston Kluwer Academic Pub. c1992Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.395 G346s] (1).

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4.
STRUCTURED LOGIN TESTING

by Eichelberger, Edward B.

Material type: book Book Description: xvii,183.Publisher: Englewood Cliffs Prentice Hall c1991Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 St89] (1).

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5.
An introduction to logic circuit testing : [electronic resource] /

by Lala, Parag K 1948-.

Material type: book Book; Format: available online remote; Literary form: not fiction ; Audience: Specialized; Description: 1 electronic text (x, 99 p. : ill.) : digital file.Publisher: San Rafael, Calif. (1537 Fourth Street, San Rafael, CA 94901 USA) : Morgan & Claypool Publishers, c2009Online access: Abstract with links to resource Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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