LOGIC TESTING AND DESIGN FOR TESTABILITY
By: Fujiwara, Hideo.
Material type:
BookSeries: Mit Press Series In Computer Systems. Publisher: Cambridge Mit Pr. 1985Description: x,284.Subject(s): Logic Circuits -- TestingDDC classification: 621.381537 | F955L
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.381537 F955L (Browse shelf) | Book Request | Available | A98464 |
Total holds: 0
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