PKK Library catalog › Results of search for 'su:{Integrated Circuits -- Very Large Scale Integration -- Testing}'

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- Feugate, Robert J. (1)
- Mcintyre, Steven M. (1)
- Peng, Ke (1)
- Touba, Nur A. [ed.] (1)
- Wang, Laung-Terng [ed.] (1)
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- PK Kelkar Library, IIT Kanpur (6)
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- PK Kelkar Library, IIT Kanpur (6)
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- Books (5)
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- Synthesis lectures on digital circuits and systems, (1)
- The Morgan Kaufmann series in systems on silicon / edited by Wayne Wolf (1)
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	1.	LSI/VLSI TESTABILITY DESIGN by Tsui, Frank F. Material type: Book; Format: print ; Literary form: not fiction Description: xv,702.Publisher: New York Mcgraw-Hill 1987Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 T789L] (1). Place hold Add to cart (remove)
	2.	INTRODUCTION TO VLSI TESTING by Feugate, Robert J \| Mcintyre, Steven M. Material type: Book; Format: print ; Literary form: not fiction Description: xiii,226.Publisher: Englewood Cliffs Prentice Hall 1988Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.38173 F434i] (1). Place hold Add to cart (remove)
	3.	POWER-CONSTRAINED TESTING OF VLSI CIRCUITS by Nicolici,Nicola \| Al-Hashimi,Bashir M. Material type: Book; Format: print ; Literary form: not fiction Description: x,178.Publisher: Kluwer Academic Publishers, Boston 2003Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.3950287 N545P] (1). Place hold Add to cart (remove)
	4.	Test and diagnosis for small-delay defects by Tehranipoor, Mohammad \| Peng, Ke. Material type: Book; Format: print ; Literary form: not fiction Description: xviii, 212p.Publisher: New York Springer 2011Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.381548 T233m] (1). Place hold Add to cart (remove)
	5.	System on chip test architectures : Nanometer design for testability by Wang, Laung-Terng [ed.] \| Stroud, Charles E. [ed.] \| Touba, Nur A. [ed.]. Material type: Article; Format: print ; Literary form: not fiction Description: xix, 856p.Publisher: Amsterdam Elsevier 2008Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.395 Sy87] (1). Place hold Add to cart (remove)
	6.	An introduction to logic circuit testing : [electronic resource] / by Lala, Parag K 1948-. Material type: Book; Format: available online ; Literary form: not fiction ; Audience: Specialized; Description: 1 electronic text (x, 99 p. : ill.) : digital file.Publisher: San Rafael, Calif. (1537 Fourth Street, San Rafael, CA 94901 USA) : Morgan & Claypool Publishers, c2009Online access: Abstract with links to resource Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1). Place hold Add to cart (remove)

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