LSI/VLSI TESTABILITY DESIGN
By: Tsui, Frank F.
Material type:
BookPublisher: New York Mcgraw-Hill 1987Description: xv,702.Subject(s): Integrated Circuits -- Large Scale Integration -- Testing | Integrated Circuits -- Very Large Scale Integration -- TestingDDC classification: 621.38173 | T789L
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38173 T789L (Browse shelf) | Book Request | Available | A97602 |
Total holds: 0
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