Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

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1. Fundamentals of surface and thin film analysis

by Feldman, Leonard C | Mayer, James W [ed.].

Material type: book Book; Format: print ; Literary form: not fiction Description: xviii,352p.Publisher: New York North-Holland 1986Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 530.41 F333F] (1).

2. FUNDAMENTALS OF NANOSCALE FILM ANALYSIS

by Alford,Terry L | Feldman, Leonard C | Mayer, James W.

Material type: book Book; Format: print ; Literary form: not fiction Description: xiv, 336p.Publisher: New York Springer Science+Business Media Inc. 2007Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 530.4275 AL28F cop.1] (2).

3. Fundamentals of Nanoscale Film Analysis : [electronic resource] /

by Alford, Terry L [author.] | Feldman, Leonard C [author.] | Mayer, James W [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: not fiction Description: XIV, 336 p. online resource.Publisher: Boston, MA : Springer US, 2007.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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