Fundamentals of surface and thin film analysis
By: Feldman, Leonard C.
Contributor(s): Mayer, James W [ed.].
Material type:
BookPublisher: New York North-Holland 1986Description: xviii,352p.ISBN: 0444009892.Subject(s): Surfaces (Technology) -- AnalysisDDC classification: 530.41 | F333F
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | General Stacks | 530.41 F333F (Browse shelf) | Available | A95274 |
Total holds: 0
There are no comments for this item.