FUNDAMENTALS OF NANOSCALE FILM ANALYSIS
By: Alford,Terry L.
Contributor(s): Feldman, Leonard C | Mayer, James W.
Material type:
BookPublisher: New York Springer Science+Business Media Inc. 2007Description: xiv, 336p.ISBN: 9780387292601.Subject(s): Thin Films | Nanostructured MaterialsDDC classification: 530.4275 | Al28f
| Item type | Current location | Collection | Call number | url | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 530.4275 AL28F cop.1 (Browse shelf) | cop.1 | Available | A158410 | |||
|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 530.4275 AL28F cop.2 (Browse shelf) | cop.2 | Available | A158689 |
Total holds: 0
There are no comments for this item.