Characterization and Metrology for ULSI Technology
By: International Conference on Characterization and Metrology for ULSI Technology Richardson, Texas.
Contributor(s): Seiler, David G.(Ed.) | .
Series: AIP conference proceedings.Publisher: New York American Institute Of Physics,New York 2005Description: xx, 667p.ISBN: 0735402779.Subject(s): MetrologyDDC classification: 621.395 | In8c| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.395 In8c (Browse shelf) | Book Request | Available | A161303 |
Total holds: 0
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| 621.395 H946V VLSI CUSTOM MICROELECTRONICS | 621.395 IB7I INTRODUCTION TO APPLIED FUZZY ELECTRONICS | 621.395 IN7C COMPUTER DESIGN, VLSI IN COMPUTERS AND PROCESSORS | 621.395 In8c Characterization and Metrology for ULSI Technology | 621.395 IN8I MULTIPLE-VALUED LOGIC | 621.395 IN8V VLSI DESIGN | 621.395 J74a ARTIFICAL INTELLIGENCE APPROACH TO VLSI ROUTING |
Includes bibliographical references and index.
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