000 -LEADER |
fixed length control field |
00725 a2200205 4500 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0735402779 |
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
621.395 |
Item number |
In8c |
111 ## - MAIN ENTRY--MEETING NAME |
Meeting name or jurisdiction name as entry element |
International Conference on Characterization and Metrology for ULSI Technology |
Location of meeting |
Richardson, Texas |
Date of meeting |
2005 |
245 1# - TITLE STATEMENT |
Title |
Characterization and Metrology for ULSI Technology |
Statement of responsibility, etc. |
editors, David G. Seiler ... [et al.] |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
New York |
Name of publisher, distributor, etc. |
American Institute Of Physics,New York |
Date of publication, distribution, etc. |
2005 |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xx, 667p. |
490 ## - SERIES STATEMENT |
Series statement |
AIP conference proceedings |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc. note |
Includes bibliographical references and index. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Metrology |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
Seiler, David G.(Ed.) |
700 ## - ADDED ENTRY--PERSONAL NAME |
Personal name |
|
830 ## - SERIES ADDED ENTRY--UNIFORM TITLE |
Uniform title |
AIP conference proceedings ; |
830 ## - SERIES ADDED ENTRY--UNIFORM TITLE |
Volume/sequential designation |
v. no.788. |
997 ## - |
-- |
A161303 s C |