SEMICONDUCTOR RELIABILITY
By: .
Material type:
BookPublisher: Elizabeth, N. J. Engineering Pub. c1961Description: v.DDC classification: 621.38152 | Se52
| Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Books
|
PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 Se52 (Browse shelf) | Book Request | Available | 73500 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: COMPACT STORAGE (BASEMENT) Close shelf browser
| 621.38152 SE48K SELECTED PAPERS ON CCD AND CMOS IMAGERS | 621.38152 SE52 SEMICONDUCTOR MICROMACHINING | 621.38152 Se52 Semiconductor nanostructures for optoelectronic applications | 621.38152 Se52 SEMICONDUCTOR RELIABILITY | 621.38152 Se52d SEMICONDUCTOR DEVICES | 621.38152 Se52s2 SEMICONDUCTOR DATA HANDBOOK | 621.38152 Se52s2 SEMICONDUCTOR DATA HANDBOOK |
V. 1. : Based On The Conf. On Reliability Of Semiconductor Devices, 1961, Sponsored By The Working Group On Semiconductor Devices, Advisory Group On Electron Tubes, Dept. Of Defence. Ed. By John E. Sh
There are no comments for this item.