SEMICONDUCTOR RELIABILITY
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Material type: BookPublisher: Elizabeth, N. J. Engineering Pub. c1961Description: v.DDC classification: 621.38152 | Se52Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 Se52 (Browse shelf) | Book Request | Available | 73500 |
Total holds: 0
V. 1. : Based On The Conf. On Reliability Of Semiconductor Devices, 1961, Sponsored By The Working Group On Semiconductor Devices, Advisory Group On Electron Tubes, Dept. Of Defence. Ed. By John E. Sh
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