| 000 -LEADER |
|---|
| fixed length control field |
00490pam a2200133a 44500 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.38152 |
| Item number |
Se52 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
|
| 245 1# - TITLE STATEMENT |
|---|
| Title |
SEMICONDUCTOR RELIABILITY |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Elizabeth, N. J. |
| Name of publisher, distributor, etc. |
Engineering Pub. |
| Date of publication, distribution, etc. |
c1961 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
v. |
| 500 ## - GENERAL NOTE |
|---|
| General note |
V. 1. : Based On The Conf. On Reliability Of Semiconductor Devices, 1961, Sponsored By The Working Group On Semiconductor Devices, Advisory Group On Electron Tubes, Dept. Of Defence. Ed. By John E. Sh |
| 964 ## - |
|---|
| -- |
CIRC |
| 997 ## - |
|---|
| -- |
73500 s C |
