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NEW TECHNIQUE FOR QUANTITATIVE SIO2 DETERMINATIONS OF SOLICATE MATERIALS BY X-RAY DIFFRACTION ANALYSIS OF GASS

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BookPublisher: Jet Propulsion Laboratory, Pasadena, Ca 1963DDC classification: JPL | 515

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Item type	Current location	Collection	Call number	Status	Date due	Barcode	Item holds
Technical Report	PK Kelkar Library, IIT Kanpur	General Stacks	JPL 515 (Browse shelf)	Not for loan		TR17904

Total holds: 0

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Previous	JPL 510 SYSTEMATIC STATISTICS USED FOR DATA COMPRESSION IN SPACE TELEMETRY	JPL 513 A DYNAMIC PROGRAMMING ANALYSIS OF MULTIPLE GUIDANCE CORRECTIONS OF A TRAJECTORY	JPL 514 THE SOLAR-WIND VELOCITY AND ITS CORRELATION WITH COSMIC-RAY VARIATIONS AND WITH SOLAR AND GEOMAGNETIC ACTIVITY	JPL 515 NEW TECHNIQUE FOR QUANTITATIVE SIO2 DETERMINATIONS OF SOLICATE MATERIALS BY X-RAY DIFFRACTION ANALYSIS OF GASS	JPL 517 DEGRADATION OF THE POLYACENAPHTHYLENE-SODIUM COMPLEX	JPL 518 SOME EXPERIMENTAL AND THEORETICAL SIGNIFICANCES ASSOCIATED WITH IRRADIATED PROPELLANT	JPL 52 AXISYMMETRIC PRESSURE LOADING OF THIN SHELLS OF REVOLUTION	Next

Bound With Jpl 512-514,516-540.Lack No-519,522-523,526,529,531,536-537

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