NEW TECHNIQUE FOR QUANTITATIVE SIO2 DETERMINATIONS OF SOLICATE MATERIALS BY X-RAY DIFFRACTION ANALYSIS OF GASS
By: Nash,Douglas B.
Material type:
BookPublisher: Jet Propulsion Laboratory, Pasadena, Ca 1963DDC classification: JPL | 515
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Technical Report
|
PK Kelkar Library, IIT Kanpur | General Stacks | JPL 515 (Browse shelf) | Not for loan | TR17904 |
Total holds: 0
Bound With Jpl 512-514,516-540.Lack No-519,522-523,526,529,531,536-537
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