JPL / 515
Nash,Douglas B
NEW TECHNIQUE FOR QUANTITATIVE SIO2 DETERMINATIONS OF SOLICATE MATERIALS BY X-RAY DIFFRACTION ANALYSIS OF GASS / .- Jet Propulsion Laboratory, Pasadena, Ca, 1963
Bound With Jpl 512-514,516-540.Lack No-519,522-523,526,529,531,536-537
Copy Details:
Acc. No.: TR17904, Full Call No.: JPL 515, Item type: Technical Report , Location: General Stacks,
------------------------- --------------------- ------ --------- ------- ------- --------- --------
Nash,Douglas B
NEW TECHNIQUE FOR QUANTITATIVE SIO2 DETERMINATIONS OF SOLICATE MATERIALS BY X-RAY DIFFRACTION ANALYSIS OF GASS / .- Jet Propulsion Laboratory, Pasadena, Ca, 1963
Bound With Jpl 512-514,516-540.Lack No-519,522-523,526,529,531,536-537
Copy Details:
Acc. No.: TR17904, Full Call No.: JPL 515, Item type: Technical Report , Location: General Stacks,
------------------------- --------------------- ------ --------- ------- ------- --------- --------