Fundamental principles of engineering nanometrology
By: Leach, Richard K.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 620.50287 L468f (Browse shelf) | Book Request | Available | A167888 |
Total holds: 0
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620.5 W892M METASTABLE AND NANOSTRUCTURED MATERIALS | 620.5 W969m Micromachining using electrochemical discharge phenomenon | 620.50287 G159p Precision Nanometrology | 620.50287 L468f Fundamental principles of engineering nanometrology | 620.50287 N157 NANOSCALE CALIBRATION STANDARDS AND METHODS | 620.51 P38b COMPUTER ANALYSIS METHODS IN DYNAMICS | 620.51 W81RE NO.16 PT.1 THE MECHANICAL ENGINEERING LABORATORY |
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