Fundamental principles of engineering nanometrology
By: Leach, Richard K.
Material type: BookPublisher: Amsterdam Elsevier 2010Description: xxvi, 321p.ISBN: 9780080964546.Subject(s): NanotechnologyDDC classification: 620.50287 | L468fItem type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 620.50287 L468f (Browse shelf) | Book Request | Available | A167888 |
Total holds: 0
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