| 000 -LEADER |
|---|
| fixed length control field |
00479pam a2200157a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b2010 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9780080964546 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
IIT, Kanpur |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
620.50287 |
| Item number |
L468f |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Leach, Richard K. |
| 245 0# - TITLE STATEMENT |
|---|
| Title |
Fundamental principles of engineering nanometrology |
| Statement of responsibility, etc. |
Richard K. Leach |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Amsterdam |
| Name of publisher, distributor, etc. |
Elsevier |
| Date of publication, distribution, etc. |
2010 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xxvi, 321p |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Nanotechnology |
| 997 ## - |
|---|
| -- |
A167888 s C |
