FUNDAMENTALS OF NANOSCALE FILM ANALYSIS
By: Alford,Terry L.
Contributor(s): Feldman, Leonard C | Mayer, James W.
Material type:
BookPublisher: New York Springer Science+Business Media Inc. 2007Description: xiv, 336p.ISBN: 9780387292601.Subject(s): Thin Films | Nanostructured MaterialsDDC classification: 530.4275 | Al28f
| Item type | Current location | Collection | Call number | url | Copy number | Status | Date due | Barcode | Item holds |
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Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 530.4275 AL28F cop.1 (Browse shelf) | cop.1 | Available | A158410 | |||
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Books
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 530.4275 AL28F cop.2 (Browse shelf) | cop.2 | Available | A158689 |
Total holds: 0
Browsing PK Kelkar Library, IIT Kanpur Shelves , Collection code: COMPACT STORAGE (BASEMENT) Close shelf browser
| 530.427 SU16M MOTION OF BUBBLES AND DROPS IN REDUCED GRAVITY. | 530.427 SU77O SURFACE SCIENCE | 530.4275 AL28F cop.1 FUNDAMENTALS OF NANOSCALE FILM ANALYSIS | 530.4275 AL28F cop.2 FUNDAMENTALS OF NANOSCALE FILM ANALYSIS | 530.4275 B535T THIN FLIM ANALYSIS BY X-RAYS SCATTERING | 530.4275 D837 DROPS AND BUBBLES IN INTERFACIAL RESEARCH | 530.4275 F962 FUNCTIONAL THIN FLIMS AND FUNCTIONAL MATERIALS |
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