IMPURITY DIFFUSION AND GETTERING IN SILICON
Contributor(s): Washburn, Jack, ed | Pearce, Charles W., ed.
Material type:![materialTypeLabel](/opac-tmpl/lib/famfamfam/BK.png)
Item type | Current location | Collection | Call number | url | Status | Date due | Barcode | Item holds |
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PK Kelkar Library, IIT Kanpur | COMPACT STORAGE (BASEMENT) | 621.38152 IM7F (Browse shelf) | Book Request | Available | A119153 |
Total holds: 0
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621.38152 H996 HYDROGEN IN SEMICONDUCTORS AND METALS | 621.38152 Im7 IMPURITY DOPING PROCESSES IN SILICON | 621.38152 Im7d IMPURITIES, DEFECTS AND DIFFUSION IN SEMICONDUCTORS | 621.38152 IM7F IMPURITY DIFFUSION AND GETTERING IN SILICON | 621.38152 In8 INTRODUCTION TO SEMICONDUCTOR TECHNOLOGY | 621.38152 In8 ION IMPLANTATION IN SEMICONDUCTORS | 621.38152 IN8 WAFER SCALE INTEGRATION |
Includes Bibliographical References And Index.
"Proc.Of The Sym.On Impurity Diffusion And Gettering In Semiconductors...Held As Sym.C At The Mat.Res.Soc.Meeting,Nov.27-30,1984 In Boston."
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