| 000 -LEADER |
|---|
| fixed length control field |
00902pam a2200241a 44500 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
OSt |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b1985 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| ISBN |
0931837014 |
| 040 ## - CATALOGING SOURCE |
|---|
| Transcribing agency |
IIT Kanpur |
| 041 ## - LANGUAGE CODE |
|---|
| Language code of text/sound track or separate title |
eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.38152 |
| Item number |
IM7F |
| 245 1# - TITLE STATEMENT |
|---|
| Title |
IMPURITY DIFFUSION AND GETTERING IN SILICON |
| Statement of responsibility, etc |
edited by Fair, Richard B., Charles W. Pearce and Jack Washburn |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Name of publisher |
Materials Research Society |
| Year of publication |
1985 |
| Place of publication |
Pittsburgh |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Number of Pages |
xiii, 284p |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
Materials research society symposia proceedings |
| 500 ## - GENERAL NOTE |
|---|
| General note |
Includes Bibliographical References And Index. |
| 500 ## - GENERAL NOTE |
|---|
| General note |
"Proc.Of The Sym.On Impurity Diffusion And Gettering In Semiconductors...Held As Sym.C At The Mat.Res.Soc.Meeting,Nov.27-30,1984 In Boston." |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Semiconductors--Defects--Cong |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical Term |
Diffusion--Cong |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Washburn, Jack, ed. |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Pearce, Charles W., ed. |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
Books |
