| 000 -LEADER |
|---|
| fixed length control field |
00740pam a2200205a 44500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
160408b2003 xxu||||| |||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9781402076527 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
P K Kelkar Library, IIT Kanpur |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.395 |
| Item number |
R117v |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Radecka, Katarzyna |
| 245 0# - TITLE STATEMENT |
|---|
| Title |
Verification by error modeling |
| Remainder of title |
using testing techniques in hardware verification |
| Statement of responsibility, etc. |
Katarzyna Radecka and Zeljko Zilic |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
Boston |
| Name of publisher, distributor, etc. |
Kluwer Academic Publishers |
| Date of publication, distribution, etc. |
2003 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xiv, 216p |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
Frontiers In Electronics Testing / Edited By Vishwani D. Agrawal |
| Volume/sequential designation |
|
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Integrated circuits |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Very Large Scale Integration |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Computer Aided design |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Zilic, Zeljko |
| 997 ## - |
|---|
| -- |
A174930 s C |
