621.59
Ashraf, Nabil Shovon, 1974-,
Low substrate temperature modeling outlook of scaled n-MOSFET / / Nabil Shovon Ashraf. .- 1 PDF (xi, 77 pages) :. illustrations. ** Synthesis lectures on emerging engineering technologies, * # 10 2381-1439 ; )
TP482 / .A834 2018 - Synthesis digital library of engineering and computer science. Synthesis lectures on emerging engineering technologies ; # 10. .
Part of: Synthesis digital library of engineering and computer science.
Includes bibliographical references (pages 65-76).
Abstract freely available; full-text restricted to subscribers or individual document purchasers.
Compendex INSPEC Google scholar Google book search
Mode of access: World Wide Web.
System requirements: Adobe Acrobat Reader.
ISBN: 9781681733869
10.2200/S00858ED1V01Y201805EET010 doi
Subject Headings:
Low temperature engineering.;
Metal oxide semiconductor field-effect transistors.;
threshold voltage substrate temperature on-state drain current subthreshold leakage current bulk mobility channel mobility surface potential inversion charge density subthreshold slope Tunnel FET silicon nanowire FET ferroelectric FET
Copy Details:
Acc. No.: EBKE810, Full Call No.: , Item type: E books , Location: ,
------------------------- --------------------- ------ --------- ------- ------- --------- --------
Ashraf, Nabil Shovon, 1974-,
Low substrate temperature modeling outlook of scaled n-MOSFET / / Nabil Shovon Ashraf. .- 1 PDF (xi, 77 pages) :. illustrations. ** Synthesis lectures on emerging engineering technologies, * # 10 2381-1439 ; )
TP482 / .A834 2018 - Synthesis digital library of engineering and computer science. Synthesis lectures on emerging engineering technologies ; # 10. .
Part of: Synthesis digital library of engineering and computer science.
Includes bibliographical references (pages 65-76).
Abstract freely available; full-text restricted to subscribers or individual document purchasers.
Compendex INSPEC Google scholar Google book search
Mode of access: World Wide Web.
System requirements: Adobe Acrobat Reader.
ISBN: 9781681733869
10.2200/S00858ED1V01Y201805EET010 doi
Subject Headings:
Low temperature engineering.;
Metal oxide semiconductor field-effect transistors.;
threshold voltage substrate temperature on-state drain current subthreshold leakage current bulk mobility channel mobility surface potential inversion charge density subthreshold slope Tunnel FET silicon nanowire FET ferroelectric FET
Copy Details:
Acc. No.: EBKE810, Full Call No.: , Item type: E books , Location: ,
------------------------- --------------------- ------ --------- ------- ------- --------- --------