621.38173 / B469h
Bhattacharya, Debashis
HIERARCHICAL MODELING FOR VLSI CIRCUIT TESTING / .- Boston: Kluwer Academic Pub., c1990 .- x,159 .
ISBN: 079239058X
Subject Headings:
Very Large Scale Integration -- Testing;
Integrated Circuits -- Very Large Scale Integration -- Computer Simulation;
Author Added Entry:
Hayes, John P.;
Copy Details:
Acc. No.: A113644, Full Call No.: 621.38173 B469h, Item type: Books , Location: General Stacks,
------------------------- --------------------- ------ --------- ------- ------- --------- --------
Bhattacharya, Debashis
HIERARCHICAL MODELING FOR VLSI CIRCUIT TESTING / .- Boston: Kluwer Academic Pub., c1990 .- x,159 .
ISBN: 079239058X
Subject Headings:
Very Large Scale Integration -- Testing;
Integrated Circuits -- Very Large Scale Integration -- Computer Simulation;
Author Added Entry:
Hayes, John P.;
Copy Details:
Acc. No.: A113644, Full Call No.: 621.38173 B469h, Item type: Books , Location: General Stacks,
------------------------- --------------------- ------ --------- ------- ------- --------- --------