HOT-CARRIER RELIABILITY OF MOS VLSI CIRCUITS
By: Leblebici,Yusuf.
Contributor(s): Kang,Sung-Mo (Steve).
Material type: BookPublisher: Kluwer Academic Publishers, Boston c1993Description: xvi,212.ISBN: 079239352X.Subject(s): Integrated Circuits -- Very Large Scale Integration -- Defects -- Mathematical Models | Metal Oxide Semiconductors -- Reliability -- Mathematical Models | Hot-Carriers -- Reliability -- Mathematical ModelsDDC classification: 621.395 | L492HItem type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | PK Kelkar Library, IIT Kanpur | General Stacks | 621.395 L492H (Browse shelf) | Available | A132867 |
Total holds: 0
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