621.395 / L492H
Leblebici,Yusuf
HOT-CARRIER RELIABILITY OF MOS VLSI CIRCUITS / .- Kluwer Academic Publishers, Boston, c1993 .- xvi,212 .
ISBN: 079239352X
Subject Headings:
Integrated Circuits -- Very Large Scale Integration -- Defects -- Mathematical Models;
Metal Oxide Semiconductors -- Reliability -- Mathematical Models;
Hot-Carriers -- Reliability -- Mathematical Models;
Author Added Entry:
Kang,Sung-Mo (Steve);
Copy Details:
Acc. No.: A132867, Full Call No.: 621.395 L492H, Item type: Books , Location: General Stacks,
------------------------- --------------------- ------ --------- ------- ------- --------- --------
Leblebici,Yusuf
HOT-CARRIER RELIABILITY OF MOS VLSI CIRCUITS / .- Kluwer Academic Publishers, Boston, c1993 .- xvi,212 .
ISBN: 079239352X
Subject Headings:
Integrated Circuits -- Very Large Scale Integration -- Defects -- Mathematical Models;
Metal Oxide Semiconductors -- Reliability -- Mathematical Models;
Hot-Carriers -- Reliability -- Mathematical Models;
Author Added Entry:
Kang,Sung-Mo (Steve);
Copy Details:
Acc. No.: A132867, Full Call No.: 621.395 L492H, Item type: Books , Location: General Stacks,
------------------------- --------------------- ------ --------- ------- ------- --------- --------