A practical guide to transmission electron microscopy [Vol.2] [Perpetual access] : advanced microscopy
By: Luo, Zhiping.
Series: Materials characterization and analysis collection. / edited by Richard Brundle.Publisher: New York Momentum Press 2016Description: xx, 158p.ISBN: 9781606509180.Subject(s): Transmission electron microscopyDDC classification: 502.825 | L973p Online resources: Click here to access online Summary: Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. Volume I covers the instrumentation, sample preparation, fundamental diffraction, imaging, analytical microscopy, and some newly developed microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
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E books
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PK Kelkar Library, IIT Kanpur | Electronic Resources | 502.825 L973p (Browse shelf) | Available | EBK10775 |
Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. Volume I covers the instrumentation, sample preparation, fundamental diffraction, imaging, analytical microscopy, and some newly developed microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.
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