A practical guide to transmission electron microscopy [Vol.2] [Perpetual access] (Record no. 565629)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 01834 a2200217 4500 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | OSt |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9781606509180 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | IIT Kanpur |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 502.825 |
| Item number | L973p |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Luo, Zhiping |
| 245 ## - TITLE STATEMENT | |
| Title | A practical guide to transmission electron microscopy [Vol.2] [Perpetual access] |
| Remainder of title | advanced microscopy |
| Statement of responsibility, etc | Zhiping Luo |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Name of publisher | Momentum Press |
| Year of publication | 2016 |
| Place of publication | New York |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xx, 158p |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE | |
| Title | Materials characterization and analysis collection |
| 490 ## - SERIES STATEMENT | |
| Series statement | / edited by Richard Brundle |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. Volume I covers the instrumentation, sample preparation, fundamental diffraction, imaging, analytical microscopy, and some newly developed microscopy techniques. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical Term | Transmission electron microscopy |
| 856 ## - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://ebookcentral.proquest.com/lib/iitk-ebooks/reader.action?docID=4307186&query=4307186 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | E books |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Permanent Location | Current Location | Date acquired | Source of acquisition | Cost, normal purchase price | Full call number | Accession Number | Cost, replacement price | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Electronic Resources | PK Kelkar Library, IIT Kanpur | PK Kelkar Library, IIT Kanpur | 2022-04-29 | 36 | 11928.30 | 502.825 L973p | EBK10775 | 11928.30 | E books |