Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

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1. Emerging nanotechnologies : test, defect tolerance and reliability

by | Tehranipoor, Mohammad, Ed.

Material type: book Book; Format: print ; Literary form: not fiction Description: xii, 405p.Publisher: New York Springer 2008Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 620.5 Em32] (1).

2. Test and diagnosis for small-delay defects

by Tehranipoor, Mohammad | Peng, Ke.

Material type: book Book; Format: print ; Literary form: not fiction Description: xviii, 212p.Publisher: New York Springer 2011Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.381548 T233m] (1).

3. Nanometer technology designs high-quality delay tests

by Tehranipoor, Mohammad | Ahmed, Nisar.

Material type: book Book; Format: print ; Literary form: not fiction Description: xvii, 281p.Publisher: New York Springer 2008Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 621.381548 T233n] (1).

4. Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability / : [electronic resource] :

by Tehranipoor, Mohammad [editor.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: not fiction Description: XII, 408 p. 200 illus. online resource.Publisher: Boston, MA : Springer US, 2008.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

5. Nanometer Technology Designs High-Quality Delay Tests : [electronic resource] /

by Tehranipoor, Mohammad [author.] | Ahmed, Nisar [author.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: not fiction Description: XVIII, 281 p. 140 illus. online resource.Publisher: Boston, MA : Springer US, 2008.Online access: Click here to access online Availability: Items available for loan: PK Kelkar Library, IIT Kanpur (1).

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