Welcome to P K Kelkar Library, Online Public Access Catalogue (OPAC)

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1. Data modeling for metrology and testing in measurement science

by | Pavese, Franco, Ed.

Material type: book Book; Format: print ; Literary form: not fiction Description: xvii, 489p.Publisher: Boston Birkhauser 2009Availability: Items available for loan: PK Kelkar Library, IIT Kanpur [Call number: 511.8 D262] (1).

2. Data modeling for metrology and testing in measurement science [Electronic resource]

by | Pavese, Franco [Ed.].

Material type: visual material Visual material Publisher: Boston Birkhauser 2009Availability: Items available for reference: PK Kelkar Library, IIT Kanpur [Call number: A166251 GA3.3] (1).

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