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Data modeling for metrology and testing in measurement science

By: .
Contributor(s): Pavese, Franco, Ed.
Material type: materialTypeLabelBookSeries: Modeling And Simulation In Science, Engineering And Technology / Edited By Nicola Bellomo. Publisher: Boston Birkhauser 2009Description: xvii, 489p.ISBN: 9780817645922.Subject(s): MetrologyDDC classification: 511.8 | D262
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Item type Current location Collection Call number Status Date due Barcode Item holds
Books Books PK Kelkar Library, IIT Kanpur
General Stacks 511.8 D262 (Browse shelf) Available A166251
Total holds: 0

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