HIGH RELIABILITY SCREENING OF SEMICONDUCTOR AND INTEGRATED CIRCUIT DEVICES :
By: LOMBARDI,J,MCDONOUGH,L.
Contributor(s): PADDEN,H.
Material type: BookPublisher: NASA, WASHINGTON, D.C. 1967Description: ,150.Subject(s): GeologicalDDC classification: NASA CR-721Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Technical Report | PK Kelkar Library, IIT Kanpur | General Stacks | NASA CR-721 (Browse shelf) | Not for loan | 83872 |
Total holds: 0
Bound with NASA CR-722-725
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